Search for tags by tag attributes (tag advanced search)
Be able to search for tags by their tag attributes (point source, location 1, uom, etc.)
AdminTodd Brown
(Product Manager, OSIsoft)
shared this idea
12 comments
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alassane.seck
commented
We have a category of users that have not adopted PI AF (and likely will not), and historically we also have had poor naming conventions.
The way they search is with the tag description, along with filtering with the plantcode that is a part of the tag name.
In PI Vision, there does not seem to have a way to search on both tagname and descriptor, with separate clauses.
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ehoffman
commented
As we continue to push more users towards PI Vision one of the biggest complaints we get is not being able to search by tag mask and descriptor. More options for Tag searching and AF searching would be very nice to have.
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Muthulingam-EnQuest
commented
I second this notion as my Users are complaining that they are unable to search Pi Tags using Point Attributes search feature in PI Vision.
However, in ProcessBook, users can search for a Specific PI Tag/ PI Point using the PI Tag Search Button by specifying the specific PI Point Attributes that they are looking for such as the "Instrument tag" (refer Fig. 1), however this feature is not available in PI Vision (refer Fig. 2). Users can also Add the specific PI Point Attribute in the Search Column for easy search, however this feature is also not available in PI Vision. How are the PI Vision users going to search for a PI Tag/ PI Point using a specific specific PI Point Attribute such a as the "Instrument tag" or other Point Attributes? When will this feature be added into PI Vision? -
ehoffman
commented
An advanced search option for PI tags an AF attributes would really improve the user experience. One of key complaint/questions we get from our PI Vision users is how to search for tags with the tag descriptor. I hope this can be added in a future release as we continue to move away from Process Book.
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Santiago.Yaconis
commented
What happened to the ProcessBook tag search in PI Vision?
Can you include some of those features in the PI Vision tag search?
Is there anything you can add to Vision so we can search by parameters (i.e. instrumenttag)?
Can you add columns to the search result so we can see descriptions, units, ranges, etc? -
alassane.seck
commented
While we are progressively pushing our users to use PI AF as the source of their PI Vision displays, we still have ways to go for a full adoption by everyone.
In the meantime, being able to perform searches like (Name starts with X AND Description contains Y) is a necessity for my users -
pete.long
commented
Yes, yes, yes - run into this almost every day
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mbailey
commented
Agree! Seems like a given.
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GuilhermeFerreira
commented
I've just noticed this idea is under PI Vision subject. I was looking specifically for "tag search".
My bad!
This idea https://feedback.osisoft.com/forums/555148-pi-server/suggestions/31121275-tag-search-gui-consistency-among-client-tools should be considered. -
GuilhermeFerreira
commented
This is extremely important for PI Builder! As it is the most convenient way to create\edit tags in bulk (replacement for the PI Tag Configurator) I need to be able to search tags by instrumenttag, exdesc, locationX, etc...
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Nick Grossman
commented
Yes, I'd like to be able to set this in Coresight setup. i.e. when designing a display the user attempts to search for an asset (either Pi tag or AF element), not only can they search on the name of the pi tag or the name of the AF element but some other criterion allowed by the administrator.
In my situation, I would like the descriptor to yield results too (perhaps a user checked checkbox could include/exclude Pi tag 'Descriptor' or AF element attribute 'Description').
I would like to also manually specify other attributes, for example, Pi tag InstrumentTag attribute as search criteria. -
Bill Maulsby
commented
Single name search OK for mature AF object structure but not when still migrating from tag centric environment. Still need additional tag search criteria: PointType; Mask; Source; EngUnit; Descriptor; Attribute = specified.