Support AF SDK Bulk calls for custom data reference
As a custom data reference developer, I would like my bulk AF SDK call implementation to be supported in PI Vision as this should improve the custom data reference performance when multiple custom data reference attributes are in the same display.
An end user may have a Vision display that provides an overview to hundreds of measurements. Because of AF attribute references and multi-state limits (child attributes), the total number of triggered data calls at the time of display load can be 500-700. The data calls are executed sequentially to the database, one by one. This makes the display very slow to load and it is not user-friendly.
It would tremendously speed up the display load if we could batch those 500-700 similar data calls in the custom data reference, and cut down the number of round trips to the database to just one or a few calls.
In our use case we cannot make use of linked AF tables, unfortunately. Support for batching custom data reference calls would be a major improvement, opening up new possibilities for custom development with AF SDK.