Right now I get errors in Event Viewer on my Vision server saying "Server is not available".  The server it mentions is our Dev server, which means somehow a tag or attribute got to Prod without being converted.  But the error doesn't tell me the tag or the display.  So I have no way of troubleshooting this without individually checking each and every display or spending all my time digging through the SQL to figure out where all the config information is hidden.

The other use case is: if as a PI admin I want to change the name of a PI tag or AF attribute, I would like to do a quick search of our displays to see who it would affect.  That is not possible right now.

I realize this is complicated by collections, but if I could even get displays as they are configured in their saved state, that would be far beyond what I have now.

Currently in a PI Vision Trend you can only see the full Attribute Path by hovering over the attribute name in the legend. If the attributes have differently named parent elements, then the legend will show the Parent Element and attribute name only, it will not show the parent element's parent element or more than that. If the parent elements are named the same, then the PI Vision trend will only show the Attribute name. For example, in the attached image there is a trend with 2 attributes named "Attribute", the first one has the following path: "\\AARVM1\854090\Parent1\Child 1.1\Child 1.1.1|Attribute", and the second attribute has the following path: "\\AARVM1\854090\Parent2\Child 1.1\Child 1.1.1|Attribute". Both attributes have identical names, and identical parent elements, as well as identical parent element's parent element, however the 3rd parent elements, going up the AF hierarchy, are different, but PI Vision only shows the attribute names. The only way to distinguish between either one of these attributes in the PI Vision Trend is to hover over the name of the attribute in the legend, which shows the full path. It's also not possible to distinguish between these attributes in the Trace Options without hovering over the attribute names. My suggestion, which is linked to case 854090, is to give the user an option to view the full path in the trend legend or to be able to choose how much of the full path to display in the trend legend.

It would be great to be able to define a "collection template" and use "instances" of that in different displays. If the Template is modified, all Instances are modified too.
That feature is already done in AF with template and elements.
The logical consequence would be to have that in PI Vision too.
I use a certain collection many times by copying and pasting it and adjusting the collection criteria for each. If i need to modify the collections, i either need to do it for each manually or modifying one and copy paste them all over again. Both is very time consuming.

I would like the PI Vision Display Utility to give me a warning and options if I try to move displays to a target database that has existing displays with the same names. This would avoid unintentionally creating duplicate displays with the same name.

It might also be useful if the tool gave me options in this case such as:
1) Acknowledge the warning and create the duplicate displays
2) Rename the new displays before adding them to the target database so  that they are no longer duplicate names
3) Overwrite the existing target database's displays with the new displays and keep the original target display's DisplayID.